LIAM, O’Sullivan; THOMPSON, Zoe; ROBERTS, Jack. Semiconductor Reliability Analysis via Adaptive Kriging. Optimizations in Applied Machine Learning, [S. l.], v. 1, n. 1, 2021. DOI: 10.71070/oaml.v1i1.40. Disponível em: https://ojs.mri-pub.com/index.php/OAML/article/view/40. Acesso em: 4 feb. 2026.