LI, Wei; ZHANG, Min; CHEN, Fang. Defect Classification in Wafer Inspection through k-Nearest Neighbors. Optimizations in Applied Machine Learning, [S. l.], v. 3, n. 1, 2023. Disponível em: https://ojs.mri-pub.com/index.php/OAML/article/view/33. Acesso em: 4 feb. 2026.